Fourier transform infrared and surface electromagnetic wave spectrometry of thin solid films used in radiometry

Optical properties and optical constants of thin solid films of TiN x and SnO x were investigated by means of both Fourier transform IR spectrometry and very sensitive surface electromagnetic wave phase spectrometry. Layers of TiN x have low reflectance over the UV and visible spectral regions and high reflectance in the thermal IR region. Films of partially oxidized tin, SnO x , lead to a relatively narrow low reflectance peak in the “reststrahlen” band of the crystalline quartz, which overlaps some of the CO 2 laser lines. Hence both kinds of films can be used to increase the sensitivity of radiometers made on the basis of quartz resonators.