Low-temperature X-ray powder diffraction of Bi2Sr2CaCu2Oxsuperconductor

A low-temperature X-ray powder diffractometer has been developed and applied to the measurement of lattice constants of Bi2Sr2CaCu2O x superconductor at 80 K, only 3 K higher than the critical temperature. The relationship between the lattice constants and electrical resistivity was studied. The Bi2Sr2CaCu2O x sample was prepared by solid-state reaction and sintered by a hot-press system at 750°C. Lattice constants of the Bi2Sr2CaCu2C x were measured at 293 to 80 K. The electrical resistivity of the sample, measured by the standard four-probe method, reached 0 Ω cm at 77 K. The resistivity decreased rapidly along with rapid shrinkage of the c-axial length.