Filling Pattern Measurement System Upgrade in SSRF*

Filling pattern affects various operation performance of a synchrotron light source. A new diagnostic beam charge monitor (BCM) with high bandwidth multi-channels digitizer was developed to perform bunch-by-bunch charge measurement and record filling pattern for SSRF storage ring. Signals picked up from button elec-trodes were sampled synchronously with RF frequency, and IQ (In-phase and Quadrature phase) sampling meth-od was employed for noise-filtering and phase independ-ence calibration. Layout and evaluation experiment of the system are presented in this paper.
Proceedings of the 9th Int. Particle Accelerator Conf., IPAC2018, Vancouver, BC, Canada