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THERMOREFLECTANCE MICROSCOPY: CALIBRATION OF TEMPERATURE MEASUREMENTS UPON MICROMETRIC METAL LINES APPLIED TO THERMAL CONDUCTIVITY IDENTIFICATION OF MICROMETRIC DIELECTRIC LAYER

Authors :
Stefan Dilhaire
Sebastien Jorez
Luis-David Patino Lopez
Wilfrid Claeys
Jean-Christophe Batsale
Source :
Proceeding of Heat Transfer and Transport Phenomena in Microscale.
Publication Year :
2023
Publisher :
Begellhouse, 2023.

Details

Database :
OpenAIRE
Journal :
Proceeding of Heat Transfer and Transport Phenomena in Microscale
Accession number :
edsair.doi...........7bd49e7514480d04ac84e95623f58da6

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