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Sapphire analyzers for high-resolution X-ray spectroscopy

Authors :
M. Zahid Hasan
Yuri Shvyd'ko
Ayman Said
Harald Sinn
Ahmet Alatas
Simon J. L. Billinge
Ruben Khachatryan
Wolfgang Sturhahn
Thomas S. Toellner
E. Ercan Alp
Hasan Yavaş
Source :
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 582:149-151
Publication Year :
2007
Publisher :
Elsevier BV, 2007.

Abstract

We present a sapphire ðAl2O3Þ analyzer for high-resolution X-ray spectroscopy with 31-meV energy resolution. The analyzer is designed for resonant inelastic X-ray scattering (RIXS) measurements at the CuKa absorption edge near 8990 eV. The performance of the analyzer is demonstrated by measuring phonon excitations in beryllium because of its known dynamical structure and high counting rates.

Details

ISSN :
01689002
Volume :
582
Database :
OpenAIRE
Journal :
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Accession number :
edsair.doi...........7b4b11e66e265015cddad794c1e5cfb2
Full Text :
https://doi.org/10.1016/j.nima.2007.08.095