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Use of electrodeposition for sample preparation and rejection rate prediction for assay of electroformed ultra high purity copper for 232Th and 238U prior to inductively coupled plasma mass spectrometry (ICP/MS)

Authors :
Orville T. Farmer
John E. Smart
Todd W. Hossbach
Anthony R. Day
Esther E. Mintzer
Harry S. Miley
Eric W. Hoppe
Ronald L. Brodzinski
Glen A. Warren
Craig E. Aalseth
Justin I. McIntyre
Allen Seifert
Source :
Journal of Radioanalytical and Nuclear Chemistry. 277:103-110
Publication Year :
2008
Publisher :
Springer Science and Business Media LLC, 2008.

Abstract

The search for neutrinoless double beta decay in 76Ge has driven the need for ultra-low background Ge detectors shielded by electroformed copper of ultra-high radiopurity (

Details

ISSN :
15882780 and 02365731
Volume :
277
Database :
OpenAIRE
Journal :
Journal of Radioanalytical and Nuclear Chemistry
Accession number :
edsair.doi...........7abf16e229845f290b46bcd3910c3926