Back to Search Start Over

4.2: Integrated Scan Driver with Oxide TFTs Using Floating Gate Method

Authors :
Yeon-Gon Mo
Yong-Sung Park
Sang-soo Kim
Seong-Il Park
Chul-Kyu Kang
Byung-hee Kim
Source :
SID Symposium Digest of Technical Papers. 42:25-27
Publication Year :
2011
Publisher :
Wiley, 2011.

Abstract

An on-glass integrated scan driver is proposed for oxide thin film transistors TFTs with negative threshold voltage. A coupling capacitor and a TFT for setting the initial voltage to the gate of a TFT were added to minimize the off-state current. Simulated and measured results indicate that the proposed scan driver shows no ripple and fast rise time/fall time of scan outputs. Circuit operation was verified with a 14-inch AMOLED panel.

Details

ISSN :
0097966X
Volume :
42
Database :
OpenAIRE
Journal :
SID Symposium Digest of Technical Papers
Accession number :
edsair.doi...........7a51ecc8e9057fa87a4ea1be60825fcd