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Occlusion Robust Pattern Matching Using Shape Based Eigen Templates

Authors :
Gou Koutaki
Keiichi Uchimura
Source :
IEEJ Transactions on Electronics, Information and Systems. 133:134-141
Publication Year :
2013
Publisher :
Institute of Electrical Engineers of Japan (IEE Japan), 2013.

Details

ISSN :
13488155 and 03854221
Volume :
133
Database :
OpenAIRE
Journal :
IEEJ Transactions on Electronics, Information and Systems
Accession number :
edsair.doi...........79e7edde332a49925a4bb8bafe8200fd
Full Text :
https://doi.org/10.1541/ieejeiss.133.134