Ellipsometric Characterization of Copper Deposits

The growth of copper layers electrodeposited from acidic solutions is investigated by in situ ellipsometry. The effect of nicotinic acid on the properties of the copper deposits is also reported. Refractive indices and extinction coefficients of films formed under diferent conditions were obtained by the use of optical models. The ellipsometric results can be interpreted using an anisotropic single layer model for the copper coatings which is related to the morphology of the deposits. The optical constants are strongly dependent on the deposition potential. The presence of the additive modifies slightly the optical properties of the electrodeposited copper layers.