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Lifetime performance index of electronic products
- Source :
- Microelectronics Reliability. 113:113941
- Publication Year :
- 2020
- Publisher :
- Elsevier BV, 2020.
-
Abstract
- Product lifetime is one of the most important issues associated with circular and sharing economies. In the face of global warming, increasing product quality and product lifetime can enhance product value and industry competitiveness. Many electronic products use designs with spare electronic components to enhance their reliability. To prevent the loss of generality, we assumed that an electronic product has m electronic components, that is, one primary electronic component and m-1 spare electronic components. When the primary electronic component fails, then the product will immediately switch to a spare. Under the assumption that the warranty period is L units of time, we proposed a lifetime performance index for electronic products. With an identical mean time between failure (MTBF) for each electronic component, we investigated the relationships between the number of electronic components and the lifetime performance index, failure rate, and reliability of the product. We next developed uniformly minimum variance unbiased (UMVU) estimator for the lifetime performance index of electronic products and its probability density function. Then we established the uniformly most powerful (UMP) test and the power of the test for the lifetime performance index for electronic products. Finally, we presented a numerical example to demonstrate the applicability of the proposed method and model.
- Subjects :
- Mean time between failures
Computer science
Warranty
Failure rate
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Reliability engineering
Minimum-variance unbiased estimator
Spare part
Product (mathematics)
visual_art
Electronic component
visual_art.visual_art_medium
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Reliability (statistics)
Subjects
Details
- ISSN :
- 00262714
- Volume :
- 113
- Database :
- OpenAIRE
- Journal :
- Microelectronics Reliability
- Accession number :
- edsair.doi...........79d1fa15013879ed50b4e159b4d243cc
- Full Text :
- https://doi.org/10.1016/j.microrel.2020.113941