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A magnetic force microscopy analysis of soft thin film elements
- Source :
- IEEE Transactions on Magnetics. 30:4473-4478
- Publication Year :
- 1994
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 1994.
-
Abstract
- Several different soft magnetic materials have been investigated by means of Magnetic Force Microscopy (MFM) using commercial Atomic Force Microscope (Nanoscope III) with slope detection. The observed contrast of basically solenoidal magnetization distributions in nanocrystalline Fe-Permalloy multilayer and single-layer Permalloy thin film elements not only reveals wall locations, and thus the subdivision of the magnetic volume into domains, but also a decomposition into subdomains hitherto undocumented. A strong influence of roughness on the magnetic fine structure is also demonstrated. Additional observations of the classical lancets of Goss texture in bulk Iron confirm the fact that the symmetries of the observed contrast are consistent with those of pendicular component of magnetization within a volume close to the sample surface. >
- Subjects :
- Permalloy
Condensed Matter::Materials Science
Paramagnetism
Magnetization
Materials science
Magnetic domain
Condensed matter physics
Magnetic resonance force microscopy
Electrical and Electronic Engineering
Single domain
Magnetic force microscope
Magnetic susceptibility
Electronic, Optical and Magnetic Materials
Subjects
Details
- ISSN :
- 00189464
- Volume :
- 30
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Magnetics
- Accession number :
- edsair.doi...........7977262fed587689dfba825f4fed7231