Back to Search Start Over

Application of Ion Cross Section Polishing: Comparison with Abrasive Polishing

Authors :
Byungmin Ahn
Steve Nutt
Source :
Microscopy and Microanalysis. 16:708-709
Publication Year :
2010
Publisher :
Oxford University Press (OUP), 2010.

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Subjects

Subjects :
Cross section (physics)
Materials science
Abrasive
Polishing
Composite material
Instrumentation
Ion

Details

ISSN :
14358115 and 14319276
Volume :
16
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........786bfdb2965790bea760fd75d1891cc5

Tools

Authors Abstract Subjects Details