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Doping and STM tip-induced changes to single dangling bonds on Si(001)

Authors :
Oliver Warschkow
Thilo Reusch
David R. McKenzie
Michelle Y. Simmons
Marian W. Radny
Nigel A. Marks
Phillip V. Smith
Neil J. Curson
Source :
Surface Science. 601:4036-4040
Publication Year :
2007
Publisher :
Elsevier BV, 2007.

Abstract

We have studied single Si dangling bonds on the Si(0 0 1) surface using scanning tunnelling microscopy (STM) and density functional theory (DFT) calculations. The Si dangling bonds are created by the chemisorption of single hydrogen atoms forming a Si–Si–H hemihydride. At room temperature, the hemihydride induces static buckling on adjacent Si–Si dimers. In the STM measurements, we observe that the orientation of the static buckling pattern can be reversed with tip-sample bias and influenced by the substrate doping. Our DFT calculations yield a correlation between the electron occupancy of the hemihydride Si dangling bond and the buckling orientation around it.

Details

ISSN :
00396028
Volume :
601
Database :
OpenAIRE
Journal :
Surface Science
Accession number :
edsair.doi...........77d8ef0b6e33618cc587d1e2cc93a2f1
Full Text :
https://doi.org/10.1016/j.susc.2007.04.072