Improvement of Device Characteristics Variation by using a Body-Bias Controlling Technology Based on a Hybrid Trench Isolated SOI

Authors :: Yuuichi Hirano
Y. Inoue
Yukio Maki
Takashi Ipposhi
O. Ozawa
Toshiaki Iwamatsu
Mikio Tsujiuchi
Source :: Extended Abstracts of the 2006 International Conference on Solid State Devices and Materials.
Publication Year :: 2006
Publisher :: The Japan Society of Applied Physics, 2006.

Subjects :: Materials science
Variation (linguistics)
Trench
Silicon on insulator
Engineering physics

Database :: OpenAIRE
Journal :: Extended Abstracts of the 2006 International Conference on Solid State Devices and Materials
Accession number :: edsair.doi...........779088a9e144b4795f040ce9e3855101

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