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Experiments of a Novel low on-resistance LDMOS with 3-D Floating Vertical Field Plate
- Source :
- 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD).
- Publication Year :
- 2019
- Publisher :
- IEEE, 2019.
-
Abstract
- A novel lateral double-diffused metal–oxide semiconductor (LDMOS) with three-dimensional floating vertical field plate (3-D F-VFP) is proposed in this paper. The 3-D F-VFP LDMOS features a discrete pillar-type VFP array through the N-type drift region and the VFP pillars with the same distance from the source are connected to each other to realize the equal potential. In the off-state, the potential along the drift region are pinned by the series of equal-potential F-VFP rings and a new full-region depletion mode is introduced into the bulk of the device. Therefore, the highly doped drift region is depleted by the 3-D F-VFP, establishing a self-adaptive charge balance inside the drift region. In the on-state, the current flows through the gaps among all the F-VFP pillars, preventing the long current path and reducing the on resistance $\boldsymbol{R}_{\mathbf{on}}$ . A 3-D F-VFP LDMOS is experimentally implemented, which obtains a breakdown voltage $\boldsymbol{V}_{\mathbf{B}}$ of 630 V and a $\boldsymbol{R}_{\mathbf{on}}$ of $344.8\ \mathbf{\Omega}$ compared with 550 V and $722.5\ \mathbf{\Omega}$ of the device without the F-VFP. The measured saturation current of the 3-D F-VFP LDMOS is more than 4.5 times of that of the device without F-VFP.
- Subjects :
- 010302 applied physics
Physics
LDMOS
Condensed matter physics
Series (mathematics)
business.industry
020208 electrical & electronic engineering
Doping
Charge (physics)
02 engineering and technology
01 natural sciences
Omega
Semiconductor
Saturation current
0103 physical sciences
0202 electrical engineering, electronic engineering, information engineering
Breakdown voltage
business
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD)
- Accession number :
- edsair.doi...........77827d3c9f42da481a505e9f52ffed50