Back to Search
Start Over
Electrical characterization of individual GaN nanowires
- Source :
- 63rd Device Research Conference Digest, 2005. DRC '05..
- Publication Year :
- 2005
- Publisher :
- IEEE, 2005.
-
Abstract
- The authors performed a thorough electrical characterization of hot-wall-CVD fabricated GaN nanowires (NWs) by studying over 500 single NW devices, and have extracted the growth parameters responsible for wire quality. Wires were grown by the vapor-liquid-solid mechanism
Details
- Database :
- OpenAIRE
- Journal :
- 63rd Device Research Conference Digest, 2005. DRC '05.
- Accession number :
- edsair.doi...........768586a85db85c66cf67db50f7575275
- Full Text :
- https://doi.org/10.1109/drc.2005.1553138