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On refining standard cell placement for self-aligned double patterning

Authors :
Ting-Chi Wang
Ye-Hong Chen
Sheng-He Wang
Source :
DATE
Publication Year :
2017
Publisher :
IEEE, 2017.

Abstract

In this paper, we study the problem of refining a standard cell placement for self-aligned double patterning (SADP), which asks to simultaneously refine a detailed placement and find a valid SADP layout decomposition such that both overlay violation and wirelength are as small as possible. We first present an algorithm that adopts the technique of white space insertion for an SADP-aware single-row cell placement problem. Based on the single-row algorithm, we then describe an approach to the addressed placement refinement problem. Finally, we report encouraging experimental results to support the efficacy of our approach.

Details

Database :
OpenAIRE
Journal :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017
Accession number :
edsair.doi...........75ea88f2bf383d0ccb6d35017633ad63
Full Text :
https://doi.org/10.23919/date.2017.7927227