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Electron Beam Radiation Effects on CMOS Active Pixel Sensor

Authors :
刘昌举 Liu Chang-ju
郭 旗 Guo Qi
玛丽娅 Ma Li-ya
汪 波 Wang Bo
李豫东 Li Yu-dong
文 林 Wen Lin
Source :
Chinese Journal of Luminescence. 38:182-187
Publication Year :
2017
Publisher :
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 2017.

Subjects

Subjects :
CMOS sensor
Radiation
Materials science
Cmos active pixel sensor
business.industry
Optoelectronics
Electron beam radiation
Condensed Matter Physics
business
Electronic, Optical and Magnetic Materials

Details

ISSN :
10007032
Volume :
38
Database :
OpenAIRE
Journal :
Chinese Journal of Luminescence
Accession number :
edsair.doi...........7577d49f23312f3e2aadc297b3c3bf51

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