Double shadow masking sample preparation method for in‐situ TEM characterization

Authors :: Mohan Muralikrishna Garlapati
Carmel Mary Esther Alphonse
Gerhard Wilde
Sven Hilke
Source :: Nano Select. 1:413-418
Publication Year :: 2020
Publisher :: Wiley, 2020.

Subjects :: In situ
Masking (art)
In situ transmission electron microscopy
Materials science
Optics
business.industry
Shadow
Sample preparation
business
Characterization (materials science)

Tools