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IN-PROCESS MONITORING OF FEMTOSECOND LASER MATERIAL PROCESSING
- Source :
- International Journal of Nanoscience. :761-766
- Publication Year :
- 2005
- Publisher :
- World Scientific Pub Co Pte Lt, 2005.
-
Abstract
- Recent research and development on the femtosecond laser has shown that it is a powerful tool for high precision micromachining. However, the femtosecond laser-material interaction is fast and complex due to its ultrashort pulse duration. Consequently, it is not an easy task to optimize process parameters and to ensure high-quality fabrication. In this context, we propose an in-line monitoring technique based on plasma plume diagnostics. By analyzing the spectra of the femtosecond laser-induced plasma, which was detected and analyzed using a spectrometer, the plasma temperature of the copper sample was estimated. As drilling holes and cutting lines are two common applications in industry, the relationship between the emission light and the geometry of the fabricated structure was investigated based on the time-varying signals from the photodetector. These results will help us to understand the mechanism of femtosecond laser ablation so as to achieve high quality micromachining.
- Subjects :
- Femtosecond pulse shaping
Materials science
Spectrometer
business.industry
Bioengineering
Context (language use)
Condensed Matter Physics
Laser
Computer Science Applications
law.invention
Surface micromachining
Optics
Multiphoton intrapulse interference phase scan
law
Femtosecond
Optoelectronics
General Materials Science
Electrical and Electronic Engineering
business
Ultrashort pulse
Biotechnology
Subjects
Details
- ISSN :
- 17935350 and 0219581X
- Database :
- OpenAIRE
- Journal :
- International Journal of Nanoscience
- Accession number :
- edsair.doi...........73294956ec6961be6eb39bf1efa244e2
- Full Text :
- https://doi.org/10.1142/s0219581x05003632