Structural and analytical characterization of semiconductor quantum structures by TEM

Authors :: Reinhard Schneider
Holm Kirmse
Wolfgang Neumann
Source :: Acta Crystallographica Section A Foundations of Crystallography. 56:s51-s51
Publication Year :: 2000
Publisher :: International Union of Crystallography (IUCr), 2000.

Subjects :: Materials science
Semiconductor
Structural Biology
business.industry
Transmission electron microscopy
Optoelectronics
business
Quantum
Characterization (materials science)

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