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A novel model of the gate current in heterojunction FETs

Authors :
J. Zimmermann
J. Gest
H. Fawaz
Source :
IEEE Transactions on Electron Devices. 40:846-851
Publication Year :
1993
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 1993.

Abstract

The authors present a model of the gate current in heterojunction FETs that takes into account two-dimensional electron gas effects at the heterojunction interface. The gate current results from tunnel and thermionic contributions. This model takes into account a number of technological parameters such as heterojunction barrier height, threshold voltage, gate length, and temperature. It has been tested against experimental measurements of gate current in AlGaAs/GaAs MISFETs at various temperatures. The agreement has been found quite satisfactory in a large range of temperatures. >

Details

ISSN :
00189383
Volume :
40
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices
Accession number :
edsair.doi...........71ce85d2d8d418d0f0e59d80260ea332
Full Text :
https://doi.org/10.1109/16.210189