A Custom High-Throughput Optical Mapping Instrument for Accelerated Stress Testing of PV Module Materials

Authors :: David C. Miller
Robert R. White
Joshua Morse
Imran Khan
Source :: IEEE Journal of Photovoltaics. 12:73-80
Publication Year :: 2022
Publisher :: Institute of Electrical and Electronics Engineers (IEEE), 2022.

Subjects :: business.industry
Computer science
Optical mapping
Electrical and Electronic Engineering
Condensed Matter Physics
Stress testing (software)
business
Throughput (business)
Computer hardware
Electronic, Optical and Magnetic Materials

Tools