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Measurement of Structural Parameters Based on X-Ray Emission Spectra with Energy-Dispersive Detection
- Source :
- Measurement Techniques. 59:198-201
- Publication Year :
- 2016
- Publisher :
- Springer Science and Business Media LLC, 2016.
-
Abstract
- The feasibility of using the diffraction peaks in x-ray emission spectra detected with energy dispersion for measuring the spacing between lattice planes in crystalline substances is demonstrated.
- Subjects :
- Diffraction
Materials science
Spectrometer
business.industry
Astrophysics::High Energy Astrophysical Phenomena
Applied Mathematics
010401 analytical chemistry
Analytical chemistry
X-ray
Energy dispersion
01 natural sciences
0104 chemical sciences
010309 optics
Optics
Lattice (order)
0103 physical sciences
Emission spectrum
business
Instrumentation
Subjects
Details
- ISSN :
- 15738906 and 05431972
- Volume :
- 59
- Database :
- OpenAIRE
- Journal :
- Measurement Techniques
- Accession number :
- edsair.doi...........7085b313f9797c1c19c945ea3c8ee185
- Full Text :
- https://doi.org/10.1007/s11018-016-0942-0