Back to Search Start Over

Imaging local discharge cascades for correlated electrons in WS2/WSe2 moir�� superlattices

Authors :
Li, Hongyuan
Li, Shaowei
Naik, Mit H.
Xie, Jingxu
Li, Xinyu
Regan, Emma
Wang, Danqing
Zhao, Wenyu
Yumigeta, Kentaro
Blei, Mark
Taniguchi, Takashi
Watanabe, Kenji
Tongay, Sefaattin
Zettl, Alex
Louie, Steven G.
Crommie, Michael F.
Wang, Feng
Publication Year :
2021
Publisher :
arXiv, 2021.

Abstract

Transition metal dichalcogenide (TMD) moir�� heterostructures provide an ideal platform to explore the extended Hubbard model1 where long-range Coulomb interactions play a critical role in determining strongly correlated electron states. This has led to experimental observations of Mott insulator states at half filling2-4 as well as a variety of extended Wigner crystal states at different fractional fillings5-9. Microscopic understanding of these emerging quantum phases, however, is still lacking. Here we describe a novel scanning tunneling microscopy (STM) technique for local sensing and manipulation of correlated electrons in a gated WS2/WSe2 moir�� superlattice that enables experimental extraction of fundamental extended Hubbard model parameters. We demonstrate that the charge state of local moir�� sites can be imaged by their influence on STM tunneling current, analogous to the charge-sensing mechanism in a single-electron transistor. In addition to imaging, we are also able to manipulate the charge state of correlated electrons. Discharge cascades of correlated electrons in the moir�� superlattice are locally induced by ramping the STM bias, thus enabling the nearest-neighbor Coulomb interaction (UNN) to be estimated. 2D mapping of the moir�� electron charge states also enables us to determine onsite energy fluctuations at different moir�� sites. Our technique should be broadly applicable to many semiconductor moir�� systems, offering a powerful new tool for microscopic characterization and control of strongly correlated states in moir�� superlattices.

Details

Database :
OpenAIRE
Accession number :
edsair.doi...........707abe75acb342e3305ff0c810accc0c
Full Text :
https://doi.org/10.48550/arxiv.2102.09986