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Both NOR and NAND Embedded Hybrid Flash for S-SIM Application Using 90 nm Process Technology
- Source :
- 2009 IEEE International Memory Workshop.
- Publication Year :
- 2009
- Publisher :
- IEEE, 2009.
-
Abstract
- We have firstly demonstrated a hybrid flash including both NOR and NAND cell in a single chip using 90 nm logic technology for S-SIM (Super-Subscriber Identity Module) application. The memory sizes are 16 MB NAND and 768 kB NOR flash, respectively. The flash memory cells exhibited over 10 k-cycle endurance and 10-year retention for the successful smart card application.
Details
- Database :
- OpenAIRE
- Journal :
- 2009 IEEE International Memory Workshop
- Accession number :
- edsair.doi...........706fcc334fd9724cde76ffcfd2dd0e72
- Full Text :
- https://doi.org/10.1109/imw.2009.5090582