Back to Search
Start Over
Threshold value estimation of electrical interconnect tests with scan FFs
- Source :
- IEEE CPMT Symposium Japan 2014.
- Publication Year :
- 2014
- Publisher :
- IEEE, 2014.
-
Abstract
- An estimation method of a threshold value for electrical interconnect tests is proposed for detecting open defects at interconnects between dies in a 3D IC. Threshold values of a circuit made of our prototyping IC on a printed circuit board are derived by the estimation method. The results show us that resistive open defects whose resistance is larger than 16.1Ω can be detected with a threshold value estimated by the method.
Details
- Database :
- OpenAIRE
- Journal :
- IEEE CPMT Symposium Japan 2014
- Accession number :
- edsair.doi...........6f8c78a374a1dafb15f192666bf8476e