Back to Search Start Over

Thermal simulation on typical high power diode packaging

Authors :
Richard Chen
Ben-Je Lwo
Tim Chiou
Robert Lee
Pei-Hsuan Wu
Zhong-Yi Wu
Source :
2012 7th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
Publication Year :
2012
Publisher :
IEEE, 2012.

Abstract

With the assistances from iteration methodology for heat dissipation property analyses and the effective material properties for the relatively complex PCB structures, this paper extracts the thermal resistance and the transient thermo-mechanical behaviors during reflow for two compactable high power diode packaging through the ANSYS software. After the simulations, further improvements on packaging structure designs were discussed according to the temperature and stress results.

Details

Database :
OpenAIRE
Journal :
2012 7th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
Accession number :
edsair.doi...........6f2b5264d19f30561eed097694b1d1c8
Full Text :
https://doi.org/10.1109/impact.2012.6420256