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Thickness Dependence of Domain-Wall Patterns in BiFeO3Thin Films

Authors :
Nava Setter
Cosmin S. Sandu
Arnaud Crassous
Tomas Sluka
Source :
Ferroelectrics. 480:41-48
Publication Year :
2015
Publisher :
Informa UK Limited, 2015.

Abstract

Unique properties of domain walls in ferroelectrics have been recently discovered but methods of their controlled engineering remain underdeveloped. Here we investigate the domain structure of Bi0.9La0.1FeO3 epitaxial thin films with piezoelectric force microscopy and transmission electron microscopy. We show that with increasing Bi0.9La0.1FeO3 thickness, a transition from randomly-oriented 71° domain walls to 109° domain walls stripe occurs. At intermediate thicknesses, 71° and 109° domain walls coexist together with non-ferroelastic 180° domain walls. TEM cross-section images show complex domain structure due to the interplay between electrostatic constrains imposed by the SrRuO3 electrode and mechanical constrains imposed by the DyScO3 substrate.

Details

ISSN :
15635112 and 00150193
Volume :
480
Database :
OpenAIRE
Journal :
Ferroelectrics
Accession number :
edsair.doi...........6e771842f5cc26d866bf51f3db7cd8cc