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Thickness Dependence of Domain-Wall Patterns in BiFeO3Thin Films
- Source :
- Ferroelectrics. 480:41-48
- Publication Year :
- 2015
- Publisher :
- Informa UK Limited, 2015.
-
Abstract
- Unique properties of domain walls in ferroelectrics have been recently discovered but methods of their controlled engineering remain underdeveloped. Here we investigate the domain structure of Bi0.9La0.1FeO3 epitaxial thin films with piezoelectric force microscopy and transmission electron microscopy. We show that with increasing Bi0.9La0.1FeO3 thickness, a transition from randomly-oriented 71° domain walls to 109° domain walls stripe occurs. At intermediate thicknesses, 71° and 109° domain walls coexist together with non-ferroelastic 180° domain walls. TEM cross-section images show complex domain structure due to the interplay between electrostatic constrains imposed by the SrRuO3 electrode and mechanical constrains imposed by the DyScO3 substrate.
- Subjects :
- Materials science
Condensed matter physics
business.industry
Epitaxial thin film
Piezoelectric force microscopy
Substrate (electronics)
Condensed Matter Physics
Electronic, Optical and Magnetic Materials
Domain (software engineering)
Optics
Domain wall (magnetism)
Transmission electron microscopy
Electrode
Thin film
business
Subjects
Details
- ISSN :
- 15635112 and 00150193
- Volume :
- 480
- Database :
- OpenAIRE
- Journal :
- Ferroelectrics
- Accession number :
- edsair.doi...........6e771842f5cc26d866bf51f3db7cd8cc