A.C. Conductivity of Bi[sub 2]Cu[sub 0.1]V[sub 0.9]O[sub 5.35] Films for Fuel Cell Application

The A.C. conductivity and dielectric properties of Bi2Cu0.1V0.9O5.35 thin films were studied as a function of frequency and temperature. The A.C. conductivity of Bi2Cu0.1V0.9O5.35 film increases with frequency. The low frequency region corresponds to the D.C. conductivity where the inter‐well hopping responsible for D.C. conduction completely dominates over the intra‐well hopping associated with pure A.C. conduction. Higher values of A.C. conductivity for films formed on alumina substrates predict their suitability for fuel cell application