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High performance 0.1µm gate-length planar-doped HEMTs

Authors :
B.R. Lee
Luke F. Lester
A.A. Jabra
J.M. Ballingall
R.C. Tiberio
P.M. Smith
K.H.G. Duh
P.C. Chao
Source :
1987 International Electron Devices Meeting.
Publication Year :
1987
Publisher :
IRE, 1987.

Abstract

AlGaAs/InGaAs/GaAs planar-doped pseudomorphic HEMTs with a gate length of 0.1µm have been successfully fabricated. A maximum extrinsic transconductance g m of 930 mS/mm, corresponding to an intrinsic g m of 1380 mS/mm, is observed in the devices at room temperature. A unity current gain cutoff frequency f T of ∼100 GHz was projected. A maximum gain as high as 19.3 dB was also measured at 18 GHz. At 59 GHz, the devices have demonstrated a minimum noise figure of 2.3 dB with an associated gain of 6.5 dB from one wafer, and 2.5 dB noise figure with 8.0 dB associated gain from another. At 94 GHz, ∼7 dB small signal gain was also measured from a single-stage amplifier. These are the best gain and noise results reported to date for FETs.

Details

Database :
OpenAIRE
Journal :
1987 International Electron Devices Meeting
Accession number :
edsair.doi...........6cdca86afda19f6c078fad4b325b81d7
Full Text :
https://doi.org/10.1109/iedm.1987.191445