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Simulating Downscaling of Ohmic Contacts on Wide-Bandgap Low-Resistivity Semiconductors

Authors :
Arie Ruzin
Source :
IEEE Transactions on Electron Devices. 59:1668-1671
Publication Year :
2012
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2012.

Abstract

This paper tackles the issue of downscaling of an ohmic contact from the infinite approximation to nanometer dimensions. Using the finite-element simulation program, it is shown that small-size ohmic contacts on a wide-bandgap semiconductor exhibit nonlinear current-voltage dependence in case velocity saturation is introduced. Furthermore, the dependence becomes asymmetrical around zero bias. In addition, it is shown that in small-size contacts, a nonlocal tunneling is bound to occur even in pure ohmic contacts. This may explain the absence of linear I-V curves in the reported experiments with nanometer-scale contacts.

Details

ISSN :
15579646 and 00189383
Volume :
59
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices
Accession number :
edsair.doi...........6c7fa11a07f2ddac4ff4fd0f3002338a
Full Text :
https://doi.org/10.1109/ted.2012.2190607