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Simulating Downscaling of Ohmic Contacts on Wide-Bandgap Low-Resistivity Semiconductors
- Source :
- IEEE Transactions on Electron Devices. 59:1668-1671
- Publication Year :
- 2012
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2012.
-
Abstract
- This paper tackles the issue of downscaling of an ohmic contact from the infinite approximation to nanometer dimensions. Using the finite-element simulation program, it is shown that small-size ohmic contacts on a wide-bandgap semiconductor exhibit nonlinear current-voltage dependence in case velocity saturation is introduced. Furthermore, the dependence becomes asymmetrical around zero bias. In addition, it is shown that in small-size contacts, a nonlocal tunneling is bound to occur even in pure ohmic contacts. This may explain the absence of linear I-V curves in the reported experiments with nanometer-scale contacts.
- Subjects :
- Materials science
Condensed matter physics
business.industry
Band gap
Velocity saturation
Wide-bandgap semiconductor
Condensed Matter::Mesoscopic Systems and Quantum Hall Effect
Electronic, Optical and Magnetic Materials
Semiconductor
Electrical resistivity and conductivity
Spontaneous emission
Electrical and Electronic Engineering
business
Ohmic contact
Quantum tunnelling
Subjects
Details
- ISSN :
- 15579646 and 00189383
- Volume :
- 59
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Electron Devices
- Accession number :
- edsair.doi...........6c7fa11a07f2ddac4ff4fd0f3002338a
- Full Text :
- https://doi.org/10.1109/ted.2012.2190607