New Insight Into Total-Ionizing-Dose Effect-Induced Breakdown Voltage Degradation for SOI LDMOS: Irradiation Charge Field Modulation

Authors :: Xin Zhou
Langtao Chen
Chen Chen
Ming Qiao
Zhaoji Li
Bo Zhang
Source :: IEEE Transactions on Nuclear Science. 70:659-666
Publication Year :: 2023
Publisher :: Institute of Electrical and Electronics Engineers (IEEE), 2023.

Subjects :: Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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