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A 0.13 $\mu{\hbox {m}}$ SiGe BiCMOS Technology Featuring f$_{T} $/f$_{\max}$ of 240/330 GHz and Gate Delays Below 3 ps

Authors :
Peter Schley
Bernd Heinemann
J. Borngraber
K. Schulz
Yuji Yamamoto
Juergen Drews
Bernd Tillack
R. Barth
Falk Korndörfer
Daniel Schmidt
A. Fox
Dieter Knoll
Thomas Grabolla
Wolfgang Winkler
Dirk Wolansky
G.G. Fischer
Andreas Mai
Ulrich Haak
Markus Andreas Schubert
Steffen Marschmeyer
Holger Rucker
J. Schmidt
Source :
IEEE Journal of Solid-State Circuits. 45:1678-1686
Publication Year :
2010
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2010.

Abstract

A 0.13 μm SiGe BiCMOS technology for millimeter-wave applications is presented. This technology features high-speed HBTs with peak transit frequencies fT of 240 GHz, maximum oscillation frequencies fmax of 330 GHz, and breakdown voltages BVCEO of 1.7 V along with high-voltage HBTs (fT = 50 GHz,fmax = 130 GHz, BVCEO = 3.7 V) integrated in a dual gate oxide RF-CMOS process. Ring oscillator gate delays of 2.9 ps, low-noise amplifiers for 122 GHz, and LC oscillators with fundamental-mode oscillation frequencies above 200 GHz are demonstrated.

Details

ISSN :
1558173X and 00189200
Volume :
45
Database :
OpenAIRE
Journal :
IEEE Journal of Solid-State Circuits
Accession number :
edsair.doi...........6bd8a4931d12ff4a54aba74b9fdbea53