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Advances in Scanning Microwave Impedance Microscopy

Authors :
Yongliang Yang
Ravi Chandra Chintala
Source :
Microscopy and Microanalysis. 26:2494-2495
Publication Year :
2020
Publisher :
Oxford University Press (OUP), 2020.

Subjects

Subjects :
Materials science
business.industry
Microscopy
Optoelectronics
business
Instrumentation
Electrical impedance
Microwave

Details

ISSN :
14358115 and 14319276
Volume :
26
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........6bc13a4f51a0bed68615413755cfde51
Full Text :
https://doi.org/10.1017/s1431927620021777
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