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C0G and X7R Ceramic Capacitors for High Temperature Applications

Authors :
Jim Magee
Abhijit Gurav
Reggie Phillips
Scott Carson
Source :
Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT). 2016:000290-000298
Publication Year :
2016
Publisher :
IMAPS - International Microelectronics Assembly and Packaging Society, 2016.

Abstract

For applications such as electronics for down-hole drilling and exploration, geothermal energy generation and power electronics, there is a growing need for capacitors that have robust reliability at temperatures of 150°C or above. Conventional X7R and X8R type ceramic capacitors are designed for applications up to 125°C and 150°C, respectively. At temperatures above 150°C, these types of capacitors typically suffer from degradation of reliability performance and severe reduction in capacitance, especially under DC bias conditions. A Class-I C0G dielectric has been developed using Nickel electrodes for high temperature application up to 200°C and beyond. Due to its linear dielectric nature, this material exhibits highly stable capacitance as a function of temperature and voltage. Multi-layer ceramic capacitors (MLCC) made from this material can be qualified as X9G with robust reliability. These C0G capacitors are showing robust reliability at extreme temperature of 260°C (500 degrees Fahrenheit). We have also developed a modified-X7R dielectric composition with nickel internal electrodes showing high reliability in this Class-II dielectric at 175°C. This paper will report electrical properties and reliability test data on these Class-I C0G and Class-II ceramic capacitors at high temperatures of 150–200°C and above.

Details

ISSN :
23804491
Volume :
2016
Database :
OpenAIRE
Journal :
Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT)
Accession number :
edsair.doi...........6ad63ad2111f42c41edd5eab36f6ada6
Full Text :
https://doi.org/10.4071/2016-hitec-290