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Evolution of the Sn/Ni–8.0 at.%V interfacial reaction paths

Authors :
Chia-Ming Hsu
Yu-ren Lin
Ru-Bo Chang
Hong-Ming Lin
Hsin-Jay Wu
Sinn-wen Chen
Source :
Journal of Materials Research. 26:2838-2843
Publication Year :
2011
Publisher :
Springer Science and Business Media LLC, 2011.

Abstract

Sn/Ni–8.0 at.%V (Ni–7.0 wt%V) couples are prepared and the interfacial reactions at 210 and 250 °C are examined. In the early stage of reaction at 250 °C, a T phase is formed as a result of fast diffusion of Sn into the Ni–8.0 at.%V substrate. With a longer reaction, the outer region of the T phase transforms to a Ni-depletion layer, which has not been observed previously. Both the T phase and the Ni-depletion layer are analyzed using transmission electronic microscopy. This newly found Ni-depletion layer is composed of Sn and nanosize “VSn2(V2Sn3)” particulates. The solid/solid reaction paths in the Sn/Ni–8.0 at.%V couples evolve from Sn/T/Ni–V, Sn/Ni3Sn4/T/Ni–V to Sn/Ni3Sn4/VSn2(V2Sn3). During the liquid/solid reactions, the paths are liquid/T/Ni–V, liquid/liquid + Ni3Sn4/T/Ni–V, liquid/liquid + Ni3Sn4/liquid + VSn2(V2Sn3)/T/Ni–V, and liquid/liquid + Ni3Sn4/liquid + VSn2(V2Sn3).

Details

ISSN :
20445326 and 08842914
Volume :
26
Database :
OpenAIRE
Journal :
Journal of Materials Research
Accession number :
edsair.doi...........6acc1a688043d34fef594cad43fae931