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Determination of the Interface Roughness between Ni-Coated Layer and Cu Substrate by Glow Discharge Optical Emission Spectroscopy Depth Profiling

Authors :
Jiangyong Wang
Y. Liu
Jiong Li
Wei Bing Ye
Wei Xuan Lin
Huan Sheng Li
Wei Hua Yu
Source :
Advanced Materials Research. 1094:181-187
Publication Year :
2015
Publisher :
Trans Tech Publications, Ltd., 2015.

Abstract

The depth profiles of Ni-coated copper substrates polished by different mesh size sandpapers were measured by the glow discharge optical emission spectroscopy (GDOES) depth profiling technique. The measured depth profiles were well fitted by the MRI-CRAS model developed recently on the basis of the Mixing-Roughness-Information depth (MRI) model and the CRAter-Simulation (CRAS) model, taking into account the pronounced crater effect upon GDOES depth profiling. The crater effect upon depth profiling was characterized quantitatively and the interface roughness values between the coated Ni layer and the Cu substrates were determined and compared with the ones measured by AFM.

Details

ISSN :
16628985
Volume :
1094
Database :
OpenAIRE
Journal :
Advanced Materials Research
Accession number :
edsair.doi...........6aa5f7ef06b722f370438a27e4145069