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Patch match networks: Improved two-channel and Siamese networks for image patch matching
- Source :
- Pattern Recognition Letters. 120:54-61
- Publication Year :
- 2019
- Publisher :
- Elsevier BV, 2019.
-
Abstract
- Descriptor and metric learning using deep convolutional neural networks (CNNs) have drawn attention of researchers in the domain of computer vision due to their remarkable performance over traditional methods. Different networks like two-channel, Siamese and triplet, etc., have been proposed recently with the aim to learn a metric or a low dimensional embedding from image patches and have outperformed traditional local descriptors like scale-invariant feature transform (SIFT). Plain CNNs resulting from stacking of several convolutional layers are employed in recent works. In this article, we have followed a recent approach called Deep Compare for metric and descriptor learning and have proposed improved architecture for two-channel and Siamese networks. Our proposed modification is inspired from the novel dense convolutional neural network known as DenseNet architecture. The proposed two-channel and Siamese networks employ dense convolutional layers which reuse feature maps from preceding layers. Our networks, trained with pairs of patches, outperform Deep Compare networks by a significant margin justifying the proposed architecture and obtain results comparable to triplet networks on UBC benchmark dataset. Moreover, we have obtained promising results on patch verification, image matching and patch retrieval tasks on large scale HPatches benchmark dataset using the descriptors from our Siamese network.
- Subjects :
- Matching (graph theory)
Channel (digital image)
business.industry
Computer science
ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION
Scale-invariant feature transform
Pattern recognition
02 engineering and technology
01 natural sciences
Convolutional neural network
Artificial Intelligence
Feature (computer vision)
0103 physical sciences
Signal Processing
Metric (mathematics)
0202 electrical engineering, electronic engineering, information engineering
Benchmark (computing)
Embedding
020201 artificial intelligence & image processing
Computer Vision and Pattern Recognition
Artificial intelligence
010306 general physics
business
Software
Similarity learning
Subjects
Details
- ISSN :
- 01678655
- Volume :
- 120
- Database :
- OpenAIRE
- Journal :
- Pattern Recognition Letters
- Accession number :
- edsair.doi...........6a0e54dc39983c596f0f703cd7e94f8b