Back to Search Start Over

Atomic force microscopy sees a bright future with simultaneous fluorescence imaging

Authors :
Yuen Yiu
Source :
Scilight. 2018:090002
Publication Year :
2018
Publisher :
AIP Publishing, 2018.

Abstract

A new method for aligning an AFM-tip with a fluorescence excitation beam using a 2-D galvanometer links the capabilities of the two to provide site-specific properties.

Details

ISSN :
25727907
Volume :
2018
Database :
OpenAIRE
Journal :
Scilight
Accession number :
edsair.doi...........69eea86f35565518f694bb8afd9ec339
Full Text :
https://doi.org/10.1063/1.5026781