Back to Search Start Over

Machine Learning-Based Abnormal Event Detection and Classification

Authors :
Carol Smidts
Indrajit Ray
Quanyan Zhu
Pavan Kumar Vaddi
Yunfei Zhao
Linan Huang
Xiaoxu Diao
Rakibul Talukdar
Michael C. Pietrykowski
Source :
SpringerBriefs in Computer Science ISBN: 9783031127106
Publication Year :
2022
Publisher :
Springer International Publishing, 2022.

Details

ISBN :
978-3-031-12710-6
ISBNs :
9783031127106
Database :
OpenAIRE
Journal :
SpringerBriefs in Computer Science ISBN: 9783031127106
Accession number :
edsair.doi...........69d0f5bef36701e1fd33e1389d259213
Full Text :
https://doi.org/10.1007/978-3-031-12711-3_3