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Enhancement of paramagnetic defects in yttria stabilized zirconia implanted by Cs ion irradiation
- Source :
- Journal of Alloys and Compounds. 429:25-28
- Publication Year :
- 2007
- Publisher :
- Elsevier BV, 2007.
-
Abstract
- Single crystal samples of cubic zirconia stabilized by 9.5 mol% Y2O3 (YSZ) were implanted with 200 KeV Xe ions and 400 KeV Cs ions up to a dose of 5 x 10(16) ions/cm(2), then annealed at 200, 300, and 400 degrees C for 1 h isochronously, respectively. Electron paramagnetic resonance (EPR) and cross-sectional transmission electron microscopy were used to study defect structure and radiated damage mechanism. EPR spectra showed the trigonal signal with g(parallel to) = 1.989 and g(perpendicular to) = 1.869, which exhibited axial symmetry with (111) direction as symmetry axis composed of six-fold-coordinated Zr3+ sites. Peak-to-peak intensity (per unit volume) of Cs-ion irradiated YSZ is as about 150 time as that of Xe-ion irradiated YSZ. This indicated that the concentration of six-fold-coordinated Zr3+ defects produced by Cs-ion irradiation was far more than that of Xe-ion irradiated. The cross-sectional image of the irradiated samples showed that the Cs-ion irradiation in YSZ produced more defect clusters than Xe-ion irradiation. Annealing did not produce any change for EPR signals and indicated six-fold-coordinated Zr3+ defects was stable defect structure below 400 degrees C. (c) 2006 Elsevier B.V. All rights reserved.
- Subjects :
- Materials science
Mechanical Engineering
Metals and Alloys
Analytical chemistry
Ion
law.invention
Ion implantation
Nuclear magnetic resonance
Mechanics of Materials
Transmission electron microscopy
law
Materials Chemistry
Cubic zirconia
Irradiation
Electron paramagnetic resonance
Single crystal
Yttria-stabilized zirconia
Subjects
Details
- ISSN :
- 09258388
- Volume :
- 429
- Database :
- OpenAIRE
- Journal :
- Journal of Alloys and Compounds
- Accession number :
- edsair.doi...........692dea73e3ccde21571af1b4b6d1c195