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Research on Test Flakiness: from Unit to System Testing

Authors :
Kiet Ngo
Vu Nguyen
Tien Nguyen
Source :
Proceedings of the 37th IEEE/ACM International Conference on Automated Software Engineering.
Publication Year :
2022
Publisher :
ACM, 2022.

Details

Database :
OpenAIRE
Journal :
Proceedings of the 37th IEEE/ACM International Conference on Automated Software Engineering
Accession number :
edsair.doi...........67214525a85880493bd656bd19c29f4b
Full Text :
https://doi.org/10.1145/3551349.3563242