In Situ Monitoring of Thermally Induced Effects in Nickel-Rich Layered Oxide Cathode Materials at the Atomic Level

MLA

Andreas Beyer, et al. “In Situ Monitoring of Thermally Induced Effects in Nickel-Rich Layered Oxide Cathode Materials at the Atomic Level.” ACS Applied Materials & Interfaces, vol. 12, Dec. 2020, pp. 57047–54. EBSCOhost, https://doi.org/10.1021/acsami.0c16685.

APA

Andreas Beyer, Anuj Pokle, Simon Schweidler, Matteo Bianchini, Shamail Ahmed, Jürgen Janek, Torsten Brezesinski, & Kerstin Volz. (2020). In Situ Monitoring of Thermally Induced Effects in Nickel-Rich Layered Oxide Cathode Materials at the Atomic Level. ACS Applied Materials & Interfaces, 12, 57047–57054. https://doi.org/10.1021/acsami.0c16685

Chicago

Andreas Beyer, Anuj Pokle, Simon Schweidler, Matteo Bianchini, Shamail Ahmed, Jürgen Janek, Torsten Brezesinski, and Kerstin Volz. 2020. “In Situ Monitoring of Thermally Induced Effects in Nickel-Rich Layered Oxide Cathode Materials at the Atomic Level.” ACS Applied Materials & Interfaces 12 (December): 57047–54. doi:10.1021/acsami.0c16685.