Capsule fabrication for in-situ measurement of radiation induced electrical degradation (RIED) of ceramics in HFIR

A collaborative DOE/Monbusho series of irradiation experiments is being implemented to determine, in situ, the effects of irradiation on the electrical resistivity of ceramic materials. The first experiment, TRIST-ER1, has been designed to irradiate 15 Al{sub 2}O{sub 3} test specimens at 450{degrees}C in an RB position of the High Flux Isotope Reactor (HFIR). Each test specimen is located in a sealed vanadium subcapsule with instrumentation provided to each subcapsule to measure temperature and resistance, and to place a biasing voltage across the specimen. Twelve of the specimens will be biased with 200 V/mm across the sample at all times, while three will not be biased, but can be if so desired during the irradiation. The experiment design, component fabrication, and subcapsule assembly have been completed. A three cycle irradiation, to a fast neutron (E>0.1 MeV) fluence of about 3x10{sup 25}n/m{sup 2} ({approx}3 dpa in Al{sub 2}O{sub 3}), is expected to begin early in March 1996.