Back to Search Start Over

Depth Gradient Reduced Graphene Oxide Layer via Intense Pulsed Light Annealing Process for the Flexible Resistive Random Access Memory Device

Authors :
Jong‐Whi Park
Chang‐Jin Moon
Young‐Min Ju
Yong‐Rae Jang
Simon S. Park
Hak‐Sung Kim
Source :
Advanced Electronic Materials. 8:2101018
Publication Year :
2021
Publisher :
Wiley, 2021.

Details

ISSN :
2199160X
Volume :
8
Database :
OpenAIRE
Journal :
Advanced Electronic Materials
Accession number :
edsair.doi...........65b5924e429e0fcbaab0ec9e39189b79
Full Text :
https://doi.org/10.1002/aelm.202101018