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Effect of the spectrometer slit width and charge‐coupled device detector on Raman intensities

Authors :
Ryan S. Jakubek
Source :
Journal of Raman Spectroscopy. 52:1317-1333
Publication Year :
2021
Publisher :
Wiley, 2021.

Subjects

Subjects :
Materials science
Spectrometer
business.industry
Detector
Slit
Intensity (physics)
symbols.namesake
Optics
symbols
Calibration
General Materials Science
Charge-coupled device
Slit width
Raman spectroscopy
business
Spectroscopy

Details

ISSN :
10974555 and 03770486
Volume :
52
Database :
OpenAIRE
Journal :
Journal of Raman Spectroscopy
Accession number :
edsair.doi...........65a3fb7cab7dbdb8efbccc6c757175d3
Full Text :
https://doi.org/10.1002/jrs.6138
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