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Interfacial layer formation at ZnO/CdS interface
- Source :
- Applied Surface Science. 258:8090-8093
- Publication Year :
- 2012
- Publisher :
- Elsevier BV, 2012.
-
Abstract
- We investigated the chemical bonding states at the ZnO/CdS interface by X-ray photoelectron spectroscopy (XPS) and X-ray absorption fine structure (XAFS) measurements. We found that the octahedral ZnO 6 species formed in the initial stage of the ZnO deposition from the Zn L 3 -edge X-ray absorption near-edge structure spectra. On the other hand, it is difficult to discuss the change of the chemical bonding states of the Zn atoms through the Zn 2p 3/2 and the S 2p photoelectron spectra. In addition, we suggested that CdSO 4 formed at the ZnO/CdS interface from the analysis of the O 1s photoelectron spectra. We enabled the significant investigation of the chemical bonding states at the ZnO/CdS interface by using a combination of XPS and XAFS measurements.
- Subjects :
- Materials science
Analytical chemistry
General Physics and Astronomy
Surfaces and Interfaces
General Chemistry
Condensed Matter Physics
XANES
Surfaces, Coatings and Films
X-ray absorption fine structure
Chemical bond
X-ray photoelectron spectroscopy
Octahedron
Absorption (chemistry)
Layer (electronics)
Deposition (law)
Subjects
Details
- ISSN :
- 01694332
- Volume :
- 258
- Database :
- OpenAIRE
- Journal :
- Applied Surface Science
- Accession number :
- edsair.doi...........657ee1406353c3b56cbbbbed8958ca77