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Interfacial layer formation at ZnO/CdS interface

Authors :
Yasuhiro Abe
Hiroshi Nohira
Toshiaki Ohta
Koji Nakanishi
Arata Komatsu
Takashi Minemoto
Hideyuki Takakura
Source :
Applied Surface Science. 258:8090-8093
Publication Year :
2012
Publisher :
Elsevier BV, 2012.

Abstract

We investigated the chemical bonding states at the ZnO/CdS interface by X-ray photoelectron spectroscopy (XPS) and X-ray absorption fine structure (XAFS) measurements. We found that the octahedral ZnO 6 species formed in the initial stage of the ZnO deposition from the Zn L 3 -edge X-ray absorption near-edge structure spectra. On the other hand, it is difficult to discuss the change of the chemical bonding states of the Zn atoms through the Zn 2p 3/2 and the S 2p photoelectron spectra. In addition, we suggested that CdSO 4 formed at the ZnO/CdS interface from the analysis of the O 1s photoelectron spectra. We enabled the significant investigation of the chemical bonding states at the ZnO/CdS interface by using a combination of XPS and XAFS measurements.

Details

ISSN :
01694332
Volume :
258
Database :
OpenAIRE
Journal :
Applied Surface Science
Accession number :
edsair.doi...........657ee1406353c3b56cbbbbed8958ca77