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First Soft X-ray Quantum Efficiency Measurements on Microwave Annealed Thin-Entrance Window Sensors

Authors :
Julie D. Segal
Christopher J. Kenney
Eric Gullikson
Jeffrey M. Kowalski
Jeffrey E. Kowalski
Lisa Rozario
Jasmin Hasi
Lorenzo Rota
Angelo Dragone
Source :
2021 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC).
Publication Year :
2021
Publisher :
IEEE, 2021.

Details

Database :
OpenAIRE
Journal :
2021 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
Accession number :
edsair.doi...........641d1b1e0554e1c7ffc6b9b2d82bde9f
Full Text :
https://doi.org/10.1109/nss/mic44867.2021.9875711