High-energy-resolution grazing emission X-ray fluorescence applied to the characterization of thin Al films on Si

MLA

Jakub Szlachetko, et al. “High-Energy-Resolution Grazing Emission X-Ray Fluorescence Applied to the Characterization of Thin Al Films on Si.” Spectrochimica Acta Part B: Atomic Spectroscopy, vol. 88, Oct. 2013, pp. 136–49. EBSCOhost, https://doi.org/10.1016/j.sab.2013.06.011.

APA

Jakub Szlachetko, Yves Kayser, Dariusz Banaś, Aldona Kubala-Kukuś, Joanna Hoszowska, Wei Cao, J.-Cl. Dousse, & M. Pajek. (2013). High-energy-resolution grazing emission X-ray fluorescence applied to the characterization of thin Al films on Si. Spectrochimica Acta Part B: Atomic Spectroscopy, 88, 136–149. https://doi.org/10.1016/j.sab.2013.06.011

Chicago

Jakub Szlachetko, Yves Kayser, Dariusz Banaś, Aldona Kubala-Kukuś, Joanna Hoszowska, Wei Cao, J.-Cl. Dousse, and M. Pajek. 2013. “High-Energy-Resolution Grazing Emission X-Ray Fluorescence Applied to the Characterization of Thin Al Films on Si.” Spectrochimica Acta Part B: Atomic Spectroscopy 88 (October): 136–49. doi:10.1016/j.sab.2013.06.011.